Keywords
thin films
charge traps
How to Cite
Abstract
Space charge limited currents in inhomogeneous thin film insulating systems are studied by means of numerical methods. Calculations for two spatial distribution of traps are presented. The results confirm that the influence of charge traps at the emitter is much stronger than those at the collector. The case of illumination of the emitter is also analyzed. It turns out that it is possible to find the valued of parameter describing the exponential decay of trap distribution at the emitter and the surface trap concentration for the case of illuminated sample. The paper summarizes the data concerning possibility of determination of trap distribution at the emitter in thin film insulators using photo-enhanced space-charge-limited current measurements.
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