Electrons drift mobility in amorphous anthrone layers

Abstract

There were investigated the magnitude of the mobility and the type of the mechanism of the electron transport in the amorphous antrachinone layers. Antrachinone (C14H8O2) is the molecular crystal. The antrachinone molecules are planar, centrosymmetric and posses permanent dipole moment practically equal zero. The antrachinone layerss were obtained by evaporation in vacuum under the pressure of the order of 10-5 Torr on glass plates with reduced substrate temperatures. Structural examination of the obtained antrachinone layers was made using X – ray diffraction. In order to attain that one employed an automatic diffractometer DAR. Drift electron mobility for obtained amorphous layers were determined with TOF method. Obtained mobility value, were less then 10-3 cm2/Vs and activation energy value was on the kT level.