Elimination of the impact of rc constant on transient photocurrents measured in organic layers

Abstract

We present a calculation method for elimination of the effect of the RC constant of the measuring circuit in the time-of-flight (TOF) measurements where a pulse generation of the photocurrent in a thin layer of low-molecular organic material is exploited. Presented method allows to eliminate the influence of the component of displacement current related to dielectric losses and obtaining the actual conduction current time dependence. The method was tested on the thin layers of 1,5-dihydroxynaphthalene.